DocumentCode :
2992483
Title :
Theoretical Analysis and Experimental Measurement on the Response Time of Optical Switch Based on VO2 Thin Film
Author :
Xiqu Chen ; Jie Li ; You Hu ; Ming Li
Author_Institution :
Sch. of Electr. & Electron. Eng., Wuhan Polytech. Univ., Wuhan, China
fYear :
2012
fDate :
21-23 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, the physical thermal model for a typical optical switch based on VO2 thin film is built, according to which the response time parameter expression of the optical switch is obtained in theory. The expression of the response time parameter reveals key factors relevant to the switching speed of optical switch based on VO2 thin film and theoretically gives directions to improve the switching speed of this kind of optical switch. Furthermore, the proposed measurement means of response time parameter can be utilized to practical measure and test on optical switch.
Keywords :
optical switches; optical testing; thin film devices; time measurement; vanadium compounds; VO2; optical switch; optical test; physical thermal model; response time measurement; response time parameter expression; switching speed; thin film; Heating; Optical device fabrication; Optical films; Optical switches; Semiconductor device measurement; Time factors; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Optoelectronics (SOPO), 2012 Symposium on
Conference_Location :
Shanghai
ISSN :
2156-8464
Print_ISBN :
978-1-4577-0909-8
Type :
conf
DOI :
10.1109/SOPO.2012.6270438
Filename :
6270438
Link To Document :
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