• DocumentCode
    2992570
  • Title

    CO2 Monitoring Spectrometer with 640×512 Pixel SWIR InGaAs Focal Plane Array

  • Author

    Peng, Wei ; Wu, Shixiang ; Ding, Lei ; Wang, Xianghua ; Hou, Yihe ; Liu, Jiaqing ; Tan, Chan ; Liu, Yuxuan

  • Author_Institution
    Key Lab. of Infrared Syst. Detection & Imaging Technol., Shanghai Inst. of Tech. Phys., Shanghai, China
  • fYear
    2012
  • fDate
    21-23 May 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper introduces a prototype grating spectrometer measuring atmospheric column carbon dioxide (CO2) with a 640 × 512 pixel indium gallium arsenide (InGaAs) focal plane array (FPA). The spectrometer achieves the spectral resolutions of 0.1 nm at 1.61 μm CO2 band meets the measurement requirement. The structure of the spectrometer including optics and electronics has been described in this paper. The spectrometer features a relatively fast optics, f/1.8, which benefits the sensitivity, and combines a fine slit with a large planar reflective diffraction grating. The performance of the optical design is presented to demonstrate the optical system meets the requirements for spectral resolution and sensitivity. The 640 × 512 InGaAs FPA with a low noise acquisition system serves to provide low noise spectral signals. The 640 × 512 InGaAs FPA, 25 μm pixel size, is sensitive to 0.9 μm-to-1.7μm short wave infrared (SWIR) band and features a 298 K temperature detectivity, D*, greater than 5 × 1012 cm-1√Hz/W.
  • Keywords
    III-V semiconductors; diffraction gratings; focal planes; gallium arsenide; gas sensors; indium compounds; spectrometers; CO2 monitoring spectrometer; CO2; InGaAs; SWIR; atmospheric column carbon dioxide; focal plane array; low noise acquisition system; low noise spectral signals; measurement requirement; optical design; planar reflective diffraction grating; prototype grating spectrometer; short wave infrared band; spectral resolutions; spectral sensitivity; Detectors; Gratings; Indium gallium arsenide; Noise; Optical design; Optical imaging; Optical reflection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronics (SOPO), 2012 Symposium on
  • Conference_Location
    Shanghai
  • ISSN
    2156-8464
  • Print_ISBN
    978-1-4577-0909-8
  • Type

    conf

  • DOI
    10.1109/SOPO.2012.6270441
  • Filename
    6270441