Title :
New approaches to the true worst-case evaluation in circuit tolerance analysis. II. Calculation of the outer solution by affine arithmetic
Author :
Egiziano, L. ; Femia, N. ; Spagnuolo, G.
Author_Institution :
Dipt. di Ingegneria dell´´Inf. ed Ingegneria Elettrica, Salerno Univ., Italy
Abstract :
For pt.I see ibid., p.133-9 (1998). In this paper a new approach to the calculation of the true worst-case in circuit tolerance analysis (TWC-CTA) based on affine arithmetic is presented. The method proposed solves the problem of maximizing the intrinsic overestimation error which affects interval arithmetic methods in the calculation of the TWC in CTA problems with parameters characterized by large tolerances. The joint application of the technique presented in this paper with that one presented in part I for the calculation of an underestimated solution ensures a reliable and efficient TWC evaluation
Keywords :
network analysis; tolerance analysis; affine arithmetic; circuit tolerance analysis; interval arithmetic methods; intrinsic overestimation error maximisation; outer solution calculation; true worst-case evaluation; Arithmetic; Circuit simulation; Genetic algorithms; Postal services; Simulated annealing; Stress; Tolerance analysis; Voltage;
Conference_Titel :
Computers in Power Electronics, 1998. 6th Workshop on
Conference_Location :
Cernobbio
Print_ISBN :
0-7803-4856-7
DOI :
10.1109/CIPE.1998.779671