Title :
Stored-Grain Insect Image Processing Based on a Hidden Markov Model
Author :
Lu, Yaling ; Qin, Shihong
Author_Institution :
Dept. of Electron. Inf. Eng., Wuhan Polytech. Univ., Wuhan, China
Abstract :
In order to recognize stored-grain insects by analyzing texture of the insects, a hidden Markov model (HMM) was developed to process the stored-grain insect images. First the basic theory of hidden Markov model was introduced, and then stored-grain insect image HMM was built. An improved K-mean method was used to initialize the HMM to improve algorithm efficiency and stability. Various stored-grain insect images were used to train the models using Baum-Welch algorithm. Use the trained HMM to recognize test images. The recognize accuracy rate for single insect with normal pattern is about 98%, for lateral position single insect is about 87%. The insects in the output images were counted by the method of connected component labeling, it was effectively solved the stored-grain insects´ overlapping and adhesion, and the counting accuracy was improved.
Keywords :
agricultural products; hidden Markov models; image recognition; image texture; pest control; Baum Welch algorithm; hidden Markov model; image recognition; image texture; k-mean method; stored grain insect image processing; Accuracy; Algorithm design and analysis; Biological system modeling; Hidden Markov models; Image recognition; Image segmentation; Insects; hidden Markov models; image recognition; stored-grain insects; texture understanding;
Conference_Titel :
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6880-5
DOI :
10.1109/iCECE.2010.491