• DocumentCode
    2992874
  • Title

    Interface Defective Effect on Performance of (p+)µc-SiC:H/(i)a-Si:H/(n+)a-Si:H Solar Cells

  • Author

    Wensheng Wei ; Congliang Zhang ; Feng Shan

  • Author_Institution
    Coll. of Phys. & Electron. Inf. Eng., Wenzhou Univ., Wenzhou, China
  • fYear
    2012
  • fDate
    21-23 May 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Photovoltaic cell with superstrate structure of (p+)a-SiC:H/buffer/(i)a-Si:H/(n+)a-Si:H was optimized and cell performance was analyzed by a numerical software of one-dimensional device simulation program of analysis of microelectronic and photonic structures (AMPS-1D) in this paper. The consanguineous relations between current-voltage characteristics, charge transport, heterojunction band offset and performance to the p/i interface defective states were elucidated. The results indicate that the performance shows sensitive to cell structures and material interface defective states. The optimum conversion efficiency coincides to a suitable thickness of optical absorption layer. Interface defective states especially those in p/i region can serious limit the open circuit voltage and full factor. Inserting an applicable buffer layer at p/i interface to alleviate interface states can improve the performance of studied photovoltaic cells.
  • Keywords
    amorphous semiconductors; buffer layers; hydrogen; interface states; numerical analysis; silicon compounds; solar cells; SiC:H-Si:H-Si:H; buffer layer; charge transport; consanguineous relations; conversion efficiency; current-voltage characteristics; heterojunction band offset; microelectronic structures; numerical software; one-dimensional device simulation program; open circuit voltage; optical absorption layer; p-i interface defective states; photonic structures; photovoltaic cell; solar cells; Absorption; Buffer layers; Interface states; Photonic band gap; Photovoltaic cells; Radiative recombination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronics (SOPO), 2012 Symposium on
  • Conference_Location
    Shanghai
  • ISSN
    2156-8464
  • Print_ISBN
    978-1-4577-0909-8
  • Type

    conf

  • DOI
    10.1109/SOPO.2012.6270453
  • Filename
    6270453