DocumentCode :
2992879
Title :
The inter-American metrology system (SIM) common-view GPS comparison network
Author :
Lombardi, Michael A. ; Novick, Andrew N. ; López, Jóse Mauricio ; Boulanger, Jean-Simon ; Pelletier, Raymond
Author_Institution :
National Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
2005
fDate :
29-31 Aug. 2005
Abstract :
The inter-American metrology system (SIM) consists of national metrology institutes in 34 member nations located throughout North, Central, and South America, and the Caribbean region. Currently, at least ten SIM laboratories pursue time and frequency metrology, and are responsible for maintaining the national time and frequency standards for their respective countries. To benefit these laboratories and advance metrology in the SIM region, we have developed a measurement network to continuously intercompare these standards and to make the data readily accessible to all SIM members. This network utilizes the multi-channel common-view GPS technique and the near real-time exchange of data via the Internet. This paper discusses the challenges of implementing the SIM comparison network, and provides a technical description of the measurement system supplied to participating laboratories. It describes the method used to calibrate the SIM measurement systems, and describes how the measurement results are processed and reported to the laboratories. It presents data collected from comparisons between the national frequency and time standards located in Canada, Mexico, and the United States. It validates these data by comparing them to data collected from previously established time links. It concludes with a discussion of the measurement uncertainties.
Keywords :
Global Positioning System; Internet; electronic data interchange; frequency standards; time measurement; Internet; common-view GPS comparison network; frequency metrology; frequency standards; inter-American metrology system; real-time data exchange; time metrology; Frequency; Global Positioning System; IP networks; Laboratories; Measurement standards; Measurement uncertainty; Metrology; Particle measurements; South America; Standards development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and Exposition, 2005. Proceedings of the 2005 IEEE International
Print_ISBN :
0-7803-9053-9
Type :
conf
DOI :
10.1109/FREQ.2005.1574019
Filename :
1574019
Link To Document :
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