DocumentCode :
2992884
Title :
Ultrasonic and thermo-compression gold-to-gold bonding of narrow frames for hermetic cavity sealing and electrical interconnect
Author :
Zoumpoulidis, T. ; van Delft, J. ; De Wild, M. ; Kuijpers, P.E.M. ; de Graaf, P. ; Mauczok, R. ; Biju, K. ; Bartek, M. ; Klee, Maurice M. ; Dekker, Ronald
Author_Institution :
Delft Univ. of Technol., Delft, Netherlands
fYear :
2008
fDate :
4-6 Nov. 2008
Firstpage :
1
Lastpage :
7
Abstract :
Cavity sealing based on ultrasonic or thermo-compression gold-to-gold bonding of rather narrow, 5 to 20 μm wide frames on die-to-wafer level is investigated. The seal quality is tested with an aggressive alkaline etch solution (33% KOH, at 90°C) using an aluminum test layer, which in the case of poor sealing, is readily attacked. Sealing of large cavities (~3×9 mm2) with sealing ring widths of 10 and 20 μm for the ultrasonic as well as sealing of small cavities (70×70 μm2) with a 5 μm wide sealing ring for the thermo-compression bonding is demonstrated. The thermocompression provides better bonding of the narrower features than the ultrasonic technique.
Keywords :
hermetic seals; integrated circuit interconnections; lead bonding; ultrasonic bonding; aggressive alkaline etch solution; aluminum test layer; die-to-wafer level; electrical interconnect; hermetic cavity sealing; size 5 mum to 20 mum; temperature 90 degC; thermocompression gold-to-gold bonding; ultrasonic gold-to-gold bonding technique; Bonding; Thermo-compression; ultrasonic bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang
ISSN :
1089-8190
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2008.5507813
Filename :
5507813
Link To Document :
بازگشت