Title :
Effective Electrostatic Discharge detection in equipment via EMI
Author :
Chia-Li Song ; Yeoh Teong-San
Author_Institution :
Intel Technol., Bayan Lepas, Malaysia
Abstract :
Electrostatic Discharge (ESD) is a common quality issue in the semiconductor industry. ESD can be caused by improper human handling, poor equipment grounding, triboelectric charging, frictional movement, use of insulator material and many others. It is important to have the right method to detect the ESD event effectively. This paper will illustrate an actual case study on how Electromagnetic Interference (EMI) measurement techniques can be used to effectively detect the high speed ESD events versus the conventional ESD standard practices.
Keywords :
electromagnetic interference; electrostatic discharge; EMI measurement techniques; ESD; electromagnetic interference; electrostatic discharge detection; frictional movement; improper human handling; insulator material; poor equipment grounding; semiconductor industry; triboelectric charging; Electromagnetic interference; Electronics industry; Electrostatic discharge; Electrostatic interference; Event detection; Grounding; Humans; Insulation; Measurement techniques; Semiconductor materials;
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
DOI :
10.1109/IEMT.2008.5507819