DocumentCode :
2992988
Title :
Measurement Of High Resolution Microwave Surface Emittance Using Advanced Multisensor Data Fusion Techniques
Author :
Jones, Andrew S. ; Eis, Kenneth E. ; Haar, Thomas H Vonder
Author_Institution :
Colorado State University
fYear :
1993
fDate :
22-25 Mar 1993
Firstpage :
248
Lastpage :
251
Keywords :
Application software; Atmospheric measurements; Brightness temperature; Extraterrestrial measurements; Infrared sensors; Microwave measurements; Microwave theory and techniques; Portals; Satellites; Software tools;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Combined Optical, Microwave, Earth and Atmosphere Sensing, 1993., Proceedings of IEEE Topical Symposium on
Print_ISBN :
0-7803-0969-3
Type :
conf
DOI :
10.1109/COMEAS.1993.700232
Filename :
700232
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2992988
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