• DocumentCode
    2992992
  • Title

    On comparison of NCR effectiveness with a reduced IDDQ vector set

  • Author

    Sabade, Sagar ; Walker, D.M.H.

  • Author_Institution
    Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
  • fYear
    2004
  • fDate
    25-29 April 2004
  • Firstpage
    65
  • Lastpage
    70
  • Abstract
    IDDQ test-based outlier rejection becomes difficult for deep sub-micron technology chips due to increased leakage and process variations. The use of neighbor current ratio (NCR) that uses wafer-level spatial correlation for identifying outlier chips has been proposed earlier as a means of coping with these issues. Due to the slow speed of IDDQ test, there is a strong motivation to reduce the number of test vectors without compromising the fault coverage. In this paper, we examine the effectiveness of neighbor current ratio using a reduced IDDQ vector set and industrial test data.
  • Keywords
    integrated circuit testing; large scale integration; leakage currents; IDDQ test; IDDQ vector set; deep submicron technology; fault coverage; industrial test data; large scale integration; neighbor current ratio; outlier chips; wafer level spatial correlation; Chromium; Circuit faults; Circuit testing; Computer science; Geometry; Leakage current; Manufacturing industries; Manufacturing processes; Threshold voltage; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2134-7
  • Type

    conf

  • DOI
    10.1109/VTEST.2004.1299227
  • Filename
    1299227
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2992992