Reusable embedded in-circuit emulator

Author

Ing-Jer Huang ; Hsin-Ming Chen ; Chung-Fu Kao

Author_Institution

Dept. of Comput. Sci. & Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan

fYear

2001

fDate

2-2 Feb. 2001

Firstpage

33

Lastpage

34

Abstract

In this paper, we introduce the Reusable Embedded In-Circuit Emulator (EICE) and Reusable EICE development system. The main functions of the EICE we designed are testing and debugging. The architecture of EICE is reusable and based on the IEEE 1149.1 boundary scan architecture. The EICE development system can help EICE to reduce the development time for a microcontroller/microprocessor. We implemented EICE in ASIC and FPGA formats and the development system had been demonstrated in two microcontroller.

Keywords

application specific integrated circuits; boundary scan testing; computer debugging; computer testing; development systems; field programmable gate arrays; microcontrollers; microprocessor chips; virtual machines; ASIC format; FPGA format; IEEE 1149.1 boundary scan architecture; debugging; development system; microcontroller development; microprocessor development; reusable embedded in-circuit emulator; testing; Application specific integrated circuits; Circuit testing; Clocks; Control systems; Debugging; Field programmable gate arrays; Ice; Microcontrollers; Microprocessors; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 2001. Proceedings of the ASP-DAC 2001. Asia and South Pacific

Conference_Location

Yokohama, Japan

Print_ISBN

0-7803-6633-6

Type

conf

DOI

10.1109/ASPDAC.2001.913275

Filename

913275