Title :
On image analysis by the methods of moments
Author :
Teh, Cho-Huak ; Chin, Roland T.
Author_Institution :
Dept of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Abstract :
Various types of moments have been used to recognize image patterns in a number of applications. The authors evaluate a number of moments and addresses some fundamental questions, such as image representation ability, noise sensitivity, and information redundancy. Moments considered include regular moments, Legendre moments, Zernike moments, pseudo-Zernike moments, rotational moments and complex moments. Properties of these moments are examined in detail, and the interrelationships among them are discussed. Both theoretical and experimental results are presented
Keywords :
pattern recognition; picture processing; Legendre moments; Zernike moments; complex moments; image analysis; image representation; information redundancy; noise sensitivity; pattern recognition; picture processing; pseudo-Zernike moments; regular moments; rotational moments; Application software; Image analysis; Image recognition; Image reconstruction; Image representation; Image sampling; Moment methods; Pattern recognition; Polynomials; Stochastic resonance;
Conference_Titel :
Computer Vision and Pattern Recognition, 1988. Proceedings CVPR '88., Computer Society Conference on
Conference_Location :
Ann Arbor, MI
Print_ISBN :
0-8186-0862-5
DOI :
10.1109/CVPR.1988.196290
