On image analysis by the methods of moments

Author

Teh, Cho-Huak ; Chin, Roland T.

Author_Institution

Dept of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA

fYear

1988

fDate

5-9 Jun 1988

Firstpage

556

Lastpage

561

Abstract

Various types of moments have been used to recognize image patterns in a number of applications. The authors evaluate a number of moments and addresses some fundamental questions, such as image representation ability, noise sensitivity, and information redundancy. Moments considered include regular moments, Legendre moments, Zernike moments, pseudo-Zernike moments, rotational moments and complex moments. Properties of these moments are examined in detail, and the interrelationships among them are discussed. Both theoretical and experimental results are presented

Keywords

pattern recognition; picture processing; Legendre moments; Zernike moments; complex moments; image analysis; image representation; information redundancy; noise sensitivity; pattern recognition; picture processing; pseudo-Zernike moments; regular moments; rotational moments; Application software; Image analysis; Image recognition; Image reconstruction; Image representation; Image sampling; Moment methods; Pattern recognition; Polynomials; Stochastic resonance;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Vision and Pattern Recognition, 1988. Proceedings CVPR '88., Computer Society Conference on

Conference_Location

Ann Arbor, MI

ISSN

1063-6919

Print_ISBN

0-8186-0862-5

Type

conf

DOI

10.1109/CVPR.1988.196290

Filename

196290