Title :
Rule-based inspection of leadframes [IC manufacture]
Author :
Dainis, George A. ; Ward, Matthew O.
Author_Institution :
Texas Instrum. Inc., Attleboro, MA, USA
Abstract :
A description is given of progress toward implementing a rule-based visual inspection system. The target product for inspection is integrated-circuit lead frames. A frame-based representation system is used to describe the product and defect categories. The system uses three levels of visual inspection to identify generic and specific inspection targets and defect categories
Keywords :
computer vision; expert systems; inspection; integrated circuit manufacture; manufacturing computer control; packaging; IC lead frames; IC manufacture; computer vision; expert systems; factory automation; rule-based visual inspection system; Airports; Cameras; Data mining; Feature extraction; Head; Image analysis; Inspection; Manufacturing; Shape; Testing;
Conference_Titel :
Computer Vision and Pattern Recognition, 1988. Proceedings CVPR '88., Computer Society Conference on
Conference_Location :
Ann Arbor, MI
Print_ISBN :
0-8186-0862-5
DOI :
10.1109/CVPR.1988.196294
