Title :
A multi-configuration strategy for an application dependent testing of FPGAs
Author :
Tahoori, Mehdi B. ; McCluskey, Edward J. ; Renovell, Michel ; Faure, Philippe
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Abstract :
An application-dependent test strategy to be used by an FPGA user is presented which requires only 3 test configurations. In this specific strategy, the interconnect is first tested by modifying the logic block configuration and preserving the interconnect configuration. Then, the used logic blocks are fully tested by modifying the interconnect configuration. Results for some benchmark applications mapped into the Xilinx FPGAs are also provided.
Keywords :
fault diagnosis; field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; logic testing; Xilinx FPGA testing; application dependent testing; benchmark applications; fault diagnosis; interconnect configuration; logic block configuration; multiconfiguration strategy; test configurations; Application software; Automatic test pattern generation; Benchmark testing; Circuit testing; Fault tolerance; Field programmable gate arrays; Integrated circuit interconnections; Logic testing; Manufacturing; Programmable logic arrays;
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Print_ISBN :
0-7695-2134-7
DOI :
10.1109/VTEST.2004.1299239
