A multi-configuration strategy for an application dependent testing of FPGAs

Author

Tahoori, Mehdi B. ; McCluskey, Edward J. ; Renovell, Michel ; Faure, Philippe

Author_Institution

Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA

fYear

2004

fDate

25-29 April 2004

Firstpage

154

Lastpage

159

Abstract

An application-dependent test strategy to be used by an FPGA user is presented which requires only 3 test configurations. In this specific strategy, the interconnect is first tested by modifying the logic block configuration and preserving the interconnect configuration. Then, the used logic blocks are fully tested by modifying the interconnect configuration. Results for some benchmark applications mapped into the Xilinx FPGAs are also provided.

Keywords

fault diagnosis; field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; logic testing; Xilinx FPGA testing; application dependent testing; benchmark applications; fault diagnosis; interconnect configuration; logic block configuration; multiconfiguration strategy; test configurations; Application software; Automatic test pattern generation; Benchmark testing; Circuit testing; Fault tolerance; Field programmable gate arrays; Integrated circuit interconnections; Logic testing; Manufacturing; Programmable logic arrays;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2004. Proceedings. 22nd IEEE

ISSN

1093-0167

Print_ISBN

0-7695-2134-7

Type

conf

DOI

10.1109/VTEST.2004.1299239

Filename

1299239