DocumentCode
2993489
Title
GHz RF front-end bandwidth time domain measurement
Author
Wang, Qi ; Tang, Yi ; Soma, Mani
Author_Institution
Washington Univ., Seattle, WA, USA
fYear
2004
fDate
25-29 April 2004
Firstpage
223
Lastpage
228
Abstract
This paper proposes a method and an on-chip test circuit to measure the center frequency and the bandwidth of RF front-end circuits using the peak amplitudes and the periods of the output signal in response to a realistic step input signal. The method is also suitable for implementation in external test instrumentation.
Keywords
radiofrequency integrated circuits; time-domain analysis; RF front end bandwidth time domain measurement; RF front end circuits; center frequency measurement; external test instrumentation; on-chip test circuit; realistic step input signal; signal amplitude; Analytical models; Bandwidth; Circuit testing; Costs; Frequency domain analysis; Radio frequency; Spectral analysis; System testing; Time domain analysis; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
ISSN
1093-0167
Print_ISBN
0-7695-2134-7
Type
conf
DOI
10.1109/VTEST.2004.1299247
Filename
1299247
Link To Document