Title :
An efficient solution to the storage correspondence problem for large sequential circuits
Author :
Wanlin Cao ; Walker, Duncan M H ; Mukherjee, Rajarshi
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
Traditional state-traversal-based methods for verifying sequential circuits are computationally infeasible for circuits with a large number of memory elements. However, if the correspondence of the memory elements of the two circuits can be established, a difficult sequential verification problem can be transformed into an easier combinational verification problem. In this paper, we propose an approach that combines two complementary simulation-based methods for fast and accurate storage correspondence. Experiments on the large ISCAS89 benchmark circuits demonstrate the superiority
Keywords :
circuit analysis computing; formal verification; integrated logic circuits; sequential circuits; combinational verification problem; complementary simulation-based methods; large sequential circuits; memory elements; sequential verification problem; storage correspondence problem; Boolean functions; Circuit simulation; Computer science; Data structures; Explosions; Flip-flops; Robustness; Sequential circuits; State-space methods; Storage automation;
Conference_Titel :
Design Automation Conference, 2001. Proceedings of the ASP-DAC 2001. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
0-7803-6633-6
DOI :
10.1109/ASPDAC.2001.913301