Title :
An on-chip transfer function characterization system for analog built-in testing
Author :
Valdes-Garcia, Alberto ; Silva-Martinez, Jose ; Sánchez-Sinencio, Edgar
Author_Institution :
Analog & Mixed-Signal Center, Texas A&M Univ., College Station, TX, USA
Abstract :
A compact system for the on-chip transfer function characterization of an analog circuit is presented. It consists of a phase and amplitude detector and a signal generator. A general methodology for the use of this structure in the functional verification of a circuit under test (CUT) is provided. An integrated implementation of the proposed system in CMOS 0.35 μm technology is described along with circuit-level design considerations. Experimental results of the application of this system in the characterization of a commercial programmable gain amplifier for frequencies up to 160 MHz are also presented.
Keywords :
CMOS analogue integrated circuits; built-in self test; integrated circuit testing; phase detectors; signal generators; system-on-chip; transfer functions; 0.35 micron; CMOS technology; CUT; amplitude detector; analog built-in testing; analog circuits; circuit level design; circuit under test; on-chip transfer function characterization system; phase detector; programmable gain amplifier; signal generator; Analog circuits; CMOS technology; Circuit testing; Detectors; Integrated circuit technology; Phase detection; Signal generators; System testing; System-on-a-chip; Transfer functions;
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Print_ISBN :
0-7695-2134-7
DOI :
10.1109/VTEST.2004.1299252
