Title :
Analysis of the Output Noise Voltage in CMOS Image Sensor Readout Circuit
Author :
Yoon, Youngchang ; Lee, HoChul ; Park, Byung-Gook ; Lee, John Duk ; Shin, Hyungcheol
Author_Institution :
Seoul Nat. Univ., Seoul
fDate :
Oct. 29 2006-Dec. 1 2006
Abstract :
This work helps to predict the output noise voltage of the CMOS image sensor read out circuit based on analytic equation and noise measurement results. With this result, the relative portion of the low frequency noise and thermal noise was calculated. As a result, this work can give an idea for reducing noise voltage magnitude of the readout circuit.
Keywords :
CMOS image sensors; noise measurement; readout electronics; thermal noise; CMOS image sensor; low frequency noise; noise measurement; output noise voltage; readout circuit; thermal noise; 1f noise; CMOS image sensors; Circuit analysis; Circuit noise; Equations; Equivalent circuits; Image analysis; Low-frequency noise; Signal analysis; Voltage;
Conference_Titel :
Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
0-7803-9730-4
Electronic_ISBN :
0-7803-9731-2
DOI :
10.1109/SMELEC.2006.380778
