DocumentCode
2993610
Title
Wire strength of Cu wire on al metallization after high temperature reliability
Author
Law Chee Soon ; Krishna, Vamshi
Author_Institution
FTZ, Infineon Technol. (Malaysia) Sdn. Bhd., Batu Berendam, Malaysia
fYear
2008
fDate
4-6 Nov. 2008
Firstpage
1
Lastpage
5
Abstract
Copper wire has been introduced to replace gold or aluminum wires and gets a lot of attention due to advantages below: 1. Copper wire material cost is much lower than gold wire. 2. Faster UPH compared to aluminum wire bonder. 3. Better electrical performance in comparison with gold or aluminum wires. 4. Better thermal performance than gold or aluminum wires. To further understand the behavior and limitation about the Cu-Al system, it is essential to investigate the the reliability of the Cu wire bonds under stress, especially with current demanding applications within consumer and automotive markets. The objective of this investigation is to evaluate the wire bonding reliability of Cu wires on Al based metallizations in comparison with Au wires. Metallurgical analysis was also carried out to assess the interface reliability after thermal storage.
Keywords
aluminium; copper; lead bonding; mechanical strength; metallisation; reliability; stress effects; Al; Cu; aluminum wires; consumer-automotive markets; copper wire material cost; gold wires; high temperature reliability; interface reliability; metallurgical analysis; thermal storage; wire bonds; wire strength; Aluminum; Automotive engineering; Bonding; Copper; Costs; Gold; Metallization; Temperature; Thermal stresses; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location
Penang
ISSN
1089-8190
Print_ISBN
978-1-4244-3392-6
Electronic_ISBN
1089-8190
Type
conf
DOI
10.1109/IEMT.2008.5507847
Filename
5507847
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