DocumentCode
2993662
Title
Defects and faults in quantum cellular automata at nano scale
Author
Tahoori, Mehdi Baradaran ; Momenzadeh, Mariam ; Huang, Jing ; Lombardi, Fabrizio
Author_Institution
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
fYear
2004
fDate
25-29 April 2004
Firstpage
291
Lastpage
296
Abstract
There has been considerable research on quantum dot cellular automata (QCA) as a new computing scheme in the nano-scale regimes. The basic logic element of this technology is majority voter. In this paper, a detailed simulation-based characterization of QCA defects and study of their effects at logic-level are presented. Testing of these devices is investigated and compared with conventional CMOS-based designs. Unique testing features of designs based on this technology are presented and interesting properties have been identified.
Keywords
cellular automata; failure analysis; fault diagnosis; logic testing; quantum gates; semiconductor device testing; semiconductor quantum dots; CMOS based designs; logic element; logic level testing; majority voter; quantum dot cellular automata defects; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Fabrication; Logic devices; Logic testing; Quantum cellular automata; Quantum computing; Quantum dots;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
ISSN
1093-0167
Print_ISBN
0-7695-2134-7
Type
conf
DOI
10.1109/VTEST.2004.1299255
Filename
1299255
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