DocumentCode
2993692
Title
Research on the Reliability of the Pyxos Network
Author
Wang, Shuangqing ; Li, Hongsheng ; Xing, Jianchun ; Wang, Ping
Author_Institution
Sch. of Instrum. Sci. & Eng., Southeast Univ., Nanjing, China
fYear
2010
fDate
25-27 June 2010
Firstpage
1802
Lastpage
1806
Abstract
The LonWorks technology is now wildly used in buildings, industrial facilities and many other fields. Its interoperability and reliability have been proven extremely robust. The Pyxos, the LonWorks platform´s bottom network, extends the LonWorks into I/O buses and sensors networks. The paper mainly talks about the reliability of the Pyxos network. Firstly, the LonWorks and Pyxos technologies are viewed and the three layer´s structure is introduced. Then the reliability of Pyxos network is illuminated. We do an experiment to prove the loop topology immune from wire-broken errors. But the results show that it is not our expectation. So we design a redundant network structure, called one station and double lines redundant system, to solve the problem. With this module, the network can not be paralyzed, even if one cable line breaks off. Finally, the reliability of this structure is analyzed detailed using Markov algorithm model. The curve of the reliability is simulated also, taking the system´s reparability into account. So we draw this conclusion: the reliability of the redundant system is much higher than that of a single network line, and with the system´s reparability rate rising, the reliability is becoming higher distinctly.
Keywords
Markov processes; telecommunication network reliability; telecommunication network topology; I/O buses; LonWorks technology; Markov algorithm model; Pyxos network reliability; industrial facilities; interoperability; loop topology; redundant network structure; redundant system; reparability rate rising; sensor network; wire-broken error; Actuators; Computer network reliability; IP networks; Markov processes; Peer to peer computing; Reliability; Sensors; LonWorks; Pyxos; Redundance; Reliability; Sensor and actuator field;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-6880-5
Type
conf
DOI
10.1109/iCECE.2010.443
Filename
5630549
Link To Document