DocumentCode :
2993692
Title :
Research on the Reliability of the Pyxos Network
Author :
Wang, Shuangqing ; Li, Hongsheng ; Xing, Jianchun ; Wang, Ping
Author_Institution :
Sch. of Instrum. Sci. & Eng., Southeast Univ., Nanjing, China
fYear :
2010
fDate :
25-27 June 2010
Firstpage :
1802
Lastpage :
1806
Abstract :
The LonWorks technology is now wildly used in buildings, industrial facilities and many other fields. Its interoperability and reliability have been proven extremely robust. The Pyxos, the LonWorks platform´s bottom network, extends the LonWorks into I/O buses and sensors networks. The paper mainly talks about the reliability of the Pyxos network. Firstly, the LonWorks and Pyxos technologies are viewed and the three layer´s structure is introduced. Then the reliability of Pyxos network is illuminated. We do an experiment to prove the loop topology immune from wire-broken errors. But the results show that it is not our expectation. So we design a redundant network structure, called one station and double lines redundant system, to solve the problem. With this module, the network can not be paralyzed, even if one cable line breaks off. Finally, the reliability of this structure is analyzed detailed using Markov algorithm model. The curve of the reliability is simulated also, taking the system´s reparability into account. So we draw this conclusion: the reliability of the redundant system is much higher than that of a single network line, and with the system´s reparability rate rising, the reliability is becoming higher distinctly.
Keywords :
Markov processes; telecommunication network reliability; telecommunication network topology; I/O buses; LonWorks technology; Markov algorithm model; Pyxos network reliability; industrial facilities; interoperability; loop topology; redundant network structure; redundant system; reparability rate rising; sensor network; wire-broken error; Actuators; Computer network reliability; IP networks; Markov processes; Peer to peer computing; Reliability; Sensors; LonWorks; Pyxos; Redundance; Reliability; Sensor and actuator field;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6880-5
Type :
conf
DOI :
10.1109/iCECE.2010.443
Filename :
5630549
Link To Document :
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