• DocumentCode
    2993710
  • Title

    NGSHBI throughput optimization through innovative solution

  • Author

    Annamalai, Nagappan ; Choo Pak Kee ; Yeoh, K.S. ; Ismail, Wan Adibah Wan

  • Author_Institution
    Intel Technol., Bayan Lepas, Malaysia
  • fYear
    2008
  • fDate
    4-6 Nov. 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Productivity and cost savings are known key challenges in this competitive semiconductor industries. It has become more complex with the introduction of a new equipment, NGSHBI (Next Generation Self Heat Burn-In) integration into Test Operation. NGSHBI module was developed and deployed to support the product for Burn In requirement for chipset product. Moving into high product mix environment, the team encountered complexities with different package size design interception. With this multi form factor requirement, the design team provided fungible kit solution with new actuation bar design. The solution was not effective and also not factory friendly. This paper will outline how the key unproductive line item has been narrowed and solved through innovative solution
  • Keywords
    electronics packaging; NGSHBI throughput optimization; actuation bar design; cost savings; high product mix environment; multiform factor requirement; next generation self heat burn-in; package size design interception; semiconductor industries; Actuators; Costs; Manufacturing processes; Ovens; Packaging; Production facilities; Robots; Sockets; Testing; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
  • Conference_Location
    Penang
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-3392-6
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2008.5507850
  • Filename
    5507850