• DocumentCode
    2993766
  • Title

    A solid-state atomic frequency standard

  • Author

    White, Christopher J. ; Hajimiri, Ali

  • Author_Institution
    Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2005
  • fDate
    29-31 Aug. 2005
  • Abstract
    This paper describes a new class of frequency reference. The frequency source uses the same operating principle as a passive atomic frequency standard; however, the device is entirely solid-state, removing many cost and reliability issues associated with gas phase atomic clocks. More specifically, the "atomic resonance" is derived from zero-field magnetic resonance transitions of the vanadium ion in magnesium oxide. The characteristics of these resonances will be described in detail. The apparatus for measuring the "atomic" resonances uses a microwave resonant cavity and frequency-discriminator circuit. Using integrated circuits, the radio-frequency signal processing functions can be implemented at very low cost in a reliable manufacturing process. We discuss the system design and the measurement sensitivity. The estimated short term stability is in the range of 10-8 to 10-9 @ 1 s. Advantages of the new frequency reference may include immunity to vibration, reduced aging compared to crystal oscillators, and immediate cold start.
  • Keywords
    atomic clocks; frequency stability; frequency standards; resonant states; atomic resonance; frequency reference; frequency source; frequency-discriminator circuit; gas phase atomic clocks; magnesium oxide; microwave resonant cavity; passive atomic frequency standard; radio-frequency signal processing functions; solid-state device; vanadium ion; zero-field magnetic resonance transitions; Atomic clocks; Atomic measurements; Costs; Frequency; Integrated circuit measurements; Magnesium oxide; Magnetic resonance; Microwave measurements; Radiofrequency integrated circuits; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exposition, 2005. Proceedings of the 2005 IEEE International
  • Print_ISBN
    0-7803-9053-9
  • Type

    conf

  • DOI
    10.1109/FREQ.2005.1574061
  • Filename
    1574061