DocumentCode :
2993850
Title :
Effects of non-uniform base heating in multi stack microchannel heat sinks used for cooling high heat flux electronic chips and devices
Author :
Hegde, Pradeep G ; Seetharamu, K.N.
Author_Institution :
P.E.S. Inst. of Technol., Bangalore, India
fYear :
2008
fDate :
4-6 Nov. 2008
Firstpage :
1
Lastpage :
6
Abstract :
Microchannel heat sinks are widely regarded as being amongst the most effective heat removal techniques from the space constrained electronic devices. Electronic components and chips are often subjected to spatially varying heat fluxes and hot spots in certain regions. In the present work, effects of non-uniform base heating on the performance of stacked microchannel heat sinks cooled by forced circulated water is analyzed. Finite element method is used for the analysis wherein a self developed 12 noded element is used for channel discretization. Different types of non-uniform base heating such as non-uniform heating in the ascending and descending orders with respect to the coolant flow direction in the bottom channel, upstream half heating, downstream half heating and center half heating (similar to central hotspot) are analyzed for both parallel flow and counter flow models. The results are compared with the case of uniform heating throughout the base.
Keywords :
cooling; finite element analysis; heat sinks; microchannel flow; coolant flow direction; finite element method; heat removal techniques; high heat flux electronic chips; multistack microchannel heat sinks; nonuniform base heating; parallel flow; space constrained electronic devices; Coolants; Counting circuits; Electronic components; Electronics cooling; Finite element methods; Heat sinks; Microchannel; Performance analysis; Space heating; Water heating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang
ISSN :
1089-8190
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2008.5507856
Filename :
5507856
Link To Document :
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