Title :
Highly testable Boolean ring logic circuits
Author :
Kalay, Ugur ; Perkowski, Marek A. ; Hall, Douglas V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Portland State Univ., OR, USA
Abstract :
In this paper we show how Boolean Ring logic, a group-based logic, leads to a circuit implementation that is highly testable. We develop Boolean Ring based expressions, which we call Generalized-Literal Boolean-Ring Sum-of-Products (GL-BRSOP) and Universal-Literal Boolean-Ring Sum-of-Products (UL-BRSOP) to represent (powers of 2)-valued MVL functions. Our BRSOPs: allow MVL functions to be implemented with vectors of binary AND and EXOR gates; allow the use of a binary logic fault model; and allow a time-multiplexed implementation that is highly testable and uses less redundant circuitry
Keywords :
logic testing; multivalued logic circuits; Boolean Ring logic; GL-BRSOP; MVL functions; UL-BRSOP; binary logic fault model; group-based logic; logic circuits; testable; time-multiplexed implementation; Boolean functions; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Galois fields; Logic circuits; Logic testing;
Conference_Titel :
Multiple-Valued Logic, 1999. Proceedings. 1999 29th IEEE International Symposium on
Conference_Location :
Freiburg
Print_ISBN :
0-7695-0161-3
DOI :
10.1109/ISMVL.1999.779727
