Title :
Self-checking multiple-valued circuit based on dual-rail current-mode differential logic
Author :
Hanyu, Takahiro ; Ike, Tsukasa ; Kameyama, Michitaka
Author_Institution :
Dept. of Comput. & Math. Sci., Tohoku Univ., Sendai, Japan
Abstract :
A multiple-valued current-mode (MVCM) circuit based on dual-rail differential logic has been proposed for high-speed arithmetic systems at a low supply voltage. This paper presents a new totally self-checking circuit based on dual-rail MVCM logic, where almost all the basic components except a differential-pair circuit have been already duplicated which results in small hardware overhead compared with a non-self-checking circuit based on dual-rail MVCM logic. Moreover the performance of the proposed self-checking circuit is superior to that of full duplication of the non-self-checking circuit based on dual-rail MVCM logic in terms of transistor counts, switching delay and dynamic power dissipation under a 0.5-μm standard CMOS technology
Keywords :
current-mode logic; multivalued logic circuits; dual-rail current-mode differential logic; dynamic power dissipation; hardware overhead; high-speed arithmetic systems; self-checking multiple-valued circuit; switching delay; totally self-checking circuit; transistor counts; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic circuits; Rails; Very large scale integration; Voltage;
Conference_Titel :
Multiple-Valued Logic, 1999. Proceedings. 1999 29th IEEE International Symposium on
Conference_Location :
Freiburg
Print_ISBN :
0-7695-0161-3
DOI :
10.1109/ISMVL.1999.779728