• DocumentCode
    2993991
  • Title

    Screen and stencil printing processes for wafer backside coating

  • Author

    Whitmore, M. ; Schake, J.

  • Author_Institution
    DEK Printing Machines Ltd., Weymouth, UK
  • fYear
    2008
  • fDate
    4-6 Nov. 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Stencil printing equipment has traditionally been used in the surface mount assembly industry for solder paste printing. In recent years the flexibility of the tool has been exploited for a wide range of materials and processes to aid semiconductor packaging and assembly. One such application has been the deposition of adhesive coatings onto the backside of silicon wafers. This paper looks at the application of two totally different epoxy materials to the non active side of silicon wafers one providing a B-stageble die attach layer and one providing a protective laser-markable cover layer aimed at protecting individual die from damage during dicing. Printing trials, with the two commercially standard, non-conductive epoxy based materials were conducted. For each material, 24 200mm wafers were printed. Both screen and stencil printing processes were compared for each material. Effects of printing process parameters were also considered. Coating thickness planarity across a wafer is the key metric for a successful coating process. For each wafer processed a minimum of 16 thickness measurements were made. Results showing thickness control capability are presented. The study demonstrates that coating co-planarity accomplishing ±12.5μm @ 6 sigma control with cured thickness´s down to 30μm is possible.
  • Keywords
    adhesives; coating techniques; printing; solders; surface mount technology; thickness control; thickness measurement; wafer level packaging; B-stageble die attach layer; adhesive coating deposition; coating thickness planarity; epoxy materials; nonconductive epoxy based materials; protective laser-markable cover layer; semiconductor assembly; semiconductor packaging; silicon wafers; solder paste printing; stencil printing equipment; surface mount assembly industry; thickness control capability; thickness measurement; wafer backside coating; Assembly; Coatings; Conducting materials; Optical materials; Printing; Protection; Semiconductor device packaging; Semiconductor materials; Silicon; Thickness control; B-stage; Coating; die attach; printing; screen print; stencil print; wafers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
  • Conference_Location
    Penang
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-3392-6
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2008.5507863
  • Filename
    5507863