An approach to the built-in self-test of field programmable analog arrays

Author

Balen, T. ; Andrade, A., Jr. ; Azaïs, F. ; Lubaszewski, M. ; Renovell, M.

Author_Institution

Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil

fYear

2004

fDate

25-29 April 2004

Firstpage

383

Lastpage

388

Abstract

The use of the oscillation test strategy to test configurable analog blocks of field programmable analog arrays (FPAAs) has been proposed previously, solving the complex problem of test stimuli generation. An improvement to that technique is presented in this paper, using the resources of the FPAA to build an output response analyzer. This new approach offers a full built-in self-test scheme with no area overhead and requiring a low cost automatic test equipment. Experiments show the efficiency of the approach in detecting parametric faults of the tested components.

Keywords

automatic test equipment; built-in self test; fault diagnosis; field programmable analogue arrays; logic analysers; FPAA; automatic test equipment; built-in self-test; field programmable analog arrays; oscillation test; output response analyzer; parametric fault detection; test stimuli generation; Analog circuits; Automatic test equipment; Built-in self-test; Circuit faults; Circuit testing; Costs; Fault detection; Field programmable analog arrays; Field programmable gate arrays; Prototypes;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2004. Proceedings. 22nd IEEE

ISSN

1093-0167

Print_ISBN

0-7695-2134-7

Type

conf

DOI

10.1109/VTEST.2004.1299268

Filename

1299268