Title :
An approach to the built-in self-test of field programmable analog arrays
Author :
Balen, T. ; Andrade, A., Jr. ; Azaïs, F. ; Lubaszewski, M. ; Renovell, M.
Author_Institution :
Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
The use of the oscillation test strategy to test configurable analog blocks of field programmable analog arrays (FPAAs) has been proposed previously, solving the complex problem of test stimuli generation. An improvement to that technique is presented in this paper, using the resources of the FPAA to build an output response analyzer. This new approach offers a full built-in self-test scheme with no area overhead and requiring a low cost automatic test equipment. Experiments show the efficiency of the approach in detecting parametric faults of the tested components.
Keywords :
automatic test equipment; built-in self test; fault diagnosis; field programmable analogue arrays; logic analysers; FPAA; automatic test equipment; built-in self-test; field programmable analog arrays; oscillation test; output response analyzer; parametric fault detection; test stimuli generation; Analog circuits; Automatic test equipment; Built-in self-test; Circuit faults; Circuit testing; Costs; Fault detection; Field programmable analog arrays; Field programmable gate arrays; Prototypes;
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Print_ISBN :
0-7695-2134-7
DOI :
10.1109/VTEST.2004.1299268
