DocumentCode :
2994696
Title :
Design rewiring based on diagnosis techniques
Author :
Veneris, Andreas ; Abadir, Magdy S. ; Ting, Ivor
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
fYear :
2001
fDate :
2001
Firstpage :
479
Lastpage :
484
Abstract :
Logic optimization is the step of the VLSI design cycle where the designer performs modifications on a design to satisfy different constraints such as area, power or delay. Recently, ATPG-based design rewiring techniques for logic optimization have gained increasing popularity. In this paper we propose a novel ATPG-based design rewiring methodology that borrows from previous design error diagnosis and correction techniques. We also present examples and experiments that indicate the added potential of our approach which is expected to provide a “powerful” route to design optimization
Keywords :
VLSI; automatic test pattern generation; circuit optimisation; delays; fault diagnosis; logic CAD; logic testing; wiring; ATPG-based techniques; VLSI design cycle; area; delay; design error diagnosis; design optimization; design rewiring; diagnosis techniques; error correction techniques; logic optimization; power; Algorithm design and analysis; Circuit noise; Combinational circuits; Contracts; Design optimization; Error correction; Logic circuits; Logic design; Very large scale integration; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2001. Proceedings of the ASP-DAC 2001. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
0-7803-6633-6
Type :
conf
DOI :
10.1109/ASPDAC.2001.913354
Filename :
913354
Link To Document :
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