Title :
A Novel Two-Dimensional Micro-Displacement Sensor Based on a New Optical Structure for Equal-Inclination Interference
Author :
Zhou, Guo-Quan ; Sun, Dong-Zhen
Author_Institution :
Dept. of Phys., Wuhan Univ., Wuhan, China
Abstract :
A novel system of two-dimensional micro-displacement optical sensor is designed. This system is based on the equal-inclination interference principle in a rectangular optical cavity. By use of CCD technology and microcontroller, the signal collection, optoelectronic transform, information storage and data communication are completed; The visual display is realized by PC system and VB platform. The experimental results of fidelity simulation demonstrate that high sensitivity, up to level of 1μm~0.1μm, can be achieved. It can be used to perform the optical precision machining; the real-time measurement and monitoring of micro displacement and speed of some key hydraulic engineering and large buildings.
Keywords :
charge-coupled devices; displacement measurement; light interference; microsensors; optoelectronic devices; sensitivity; CCD technology; PC system; VB platform; data communication; equal-inclination interference principle; high sensitivity; hydraulic engineering; information storage; large buildings; microcontroller; optical precision machining; optical structure; optoelectronic transform; real-time measurement; rectangular optical cavity; signal collection; size 1 mum to 0.1 mum; two-dimensional microdisplacement sensor; visual display; Cavity resonators; Charge coupled devices; Displacement measurement; Interference; Optical interferometry; Optical sensors; Optical variables measurement;
Conference_Titel :
Photonics and Optoelectronics (SOPO), 2012 Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-0909-8
DOI :
10.1109/SOPO.2012.6270548