DocumentCode :
2994993
Title :
Research on technology selection for enterprises with tools of patent analysis
Author :
Wang Yan-ling
Author_Institution :
Sch. of Inf. Manage., Wuhan Univ., Wuhan, China
fYear :
2012
fDate :
20-22 Sept. 2012
Firstpage :
1651
Lastpage :
1657
Abstract :
This paper sets out to explore patent analysis as a tool for the technology selection of enterprises. Technology selection is the first, as well as the most important stage of the process of innovation of enterprises. The process of enterprise technology innovation includes technology selection, research and development, manufacturing and commercialization. For the stage of technology selection as a specific period of enterprise technology innovation needs to implement different analyzing methods with patent data. Within the methods part of this paper, patent analysis for chronological, terrain, trend, hot spots and cold spots are all discussed. Based on the analysis for mechanism of patent formation during the process of enterprise technology innovation, this paper demonstrated our research on the patent analysis outline for the procedure of technology selection of enterprise technology innovation. Technology characteristics of the stage of technology selection are also discussed.
Keywords :
innovation management; organisational aspects; patents; technology management; chronological; cold spots; commercialization; enterprise technology innovation; hot spots; manufacturing; patent analysis; patent data; technology development; technology selection; terrain; Forecasting; Indexes; Market research; Patents; Radiofrequency identification; Research and development; Technological innovation; enterprise; patent analysis; technological innovation; technology selection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management Science and Engineering (ICMSE), 2012 International Conference on
Conference_Location :
Dallas, TX
ISSN :
2155-1847
Print_ISBN :
978-1-4673-3015-2
Type :
conf
DOI :
10.1109/ICMSE.2012.6414394
Filename :
6414394
Link To Document :
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