Title :
What comes first-RAMCAD or a new RAM methodology?
Author_Institution :
TRW S&TG, Redondo Beach, CA, USA
Abstract :
A practical methodology of a future reliability program is discussed. Seven major lessons learned from today´s reliability methodology are also examined. These lessons are translated into requirements that can implement the projected computerized reliability programs. Draft revisions of two MIL-STD-785B tasks (204 and 205) are presented to exemplify the modernization of current reliability program requirements
Keywords :
maintenance engineering; reliability; computerized reliability programs; maintainability; modernization; Application software; Circuit analysis; Circuit analysis computing; Costs; Design automation; Design optimization; Military computing; Process design; Read-write memory; Reliability engineering;
Conference_Titel :
Reliability and Maintainability Symposium, 1988. Proceedings., Annual
Conference_Location :
Los Angeles, CA
DOI :
10.1109/ARMS.1988.196414
