Title :
Weighted bridging fault coverage using capacitance extraction
Author :
Tacey, James M. ; Lusco, Michael A. ; Qin, Jie ; Cunha, Neil S Da
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
Abstract :
In this paper we discuss the efficiency and accuracy of extracting potential bridging fault sites from a physical layout specification. Using a combination of developed tools and common layout and extraction tools, a fault file is generated with an ordered list of the most likely to occur bridging faults based on parasitic capacitance values. These faultsare then simulated and results are discussed. Using this method and the tools created, the efficiency and accuracy of simulating bridging faults can be greatly improved. This process was implemented for multiple circuits using a newly developed general purpose fault extraction tool.
Keywords :
circuit CAD; fault simulation; integrated circuit design; capacitance extraction; fault file; general purpose fault extraction tool; parasitic capacitance values; weighted bridging fault coverage; Capacitance; Circuit faults; Hardware design languages; Integrated circuit modeling; Layout; Libraries; Logic gates;
Conference_Titel :
System Theory (SSST), 2011 IEEE 43rd Southeastern Symposium on
Conference_Location :
Auburn, AL
Print_ISBN :
978-1-4244-9594-8
DOI :
10.1109/SSST.2011.5753815