A 5Gb/s CDR with automatic frequency calibration

Author

Yilmazer, Caglar ; Toker, Ali

Author_Institution

Electron. & Commun. Eng. Dept., Istanbul Tech. Univ., Istanbul, Turkey

fYear

2009

fDate

9-10 July 2009

Firstpage

1

Lastpage

4

Abstract

A new technique for VCO calibration is presented for clock and data recovery (CDR) circuits. This method is applicable to current controlled oscillators. After the frequency lock is achieved, the oscillator current is sampled by a simple current mode analog to digital converter (ADC) and a narrower range is generated around the sampled point. A CDR system, which operates at 5-Gb/s data rate, is designed and simulated in 0.18-mum CMOS technology to verify the proposed method.

Keywords

CMOS integrated circuits; analogue-digital conversion; calibration; clock and data recovery circuits; voltage-controlled oscillators; CDR circuits; CMOS technology; VCO; analog to digital converter; automatic frequency calibration; clock and data recovery; current controlled oscillators; Automatic frequency control; CMOS technology; Calibration; Clocks; Phase frequency detector; Phase locked loops; Ring oscillators; Temperature distribution; Voltage control; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Signals, Circuits and Systems, 2009. ISSCS 2009. International Symposium on

Conference_Location

Iasi

Print_ISBN

978-1-4244-3785-6

Electronic_ISBN

978-1-4244-3786-3

Type

conf

DOI

10.1109/ISSCS.2009.5206194

Filename

5206194