DocumentCode :
2995358
Title :
Self-test of timing and control circuitry
Author :
Buswell, Steven M. ; Graves, Francis P.
Author_Institution :
Westinghouse Electr. Corp., Baltimore, MD, USA
fYear :
1988
fDate :
26-28 Jan 1988
Firstpage :
108
Lastpage :
111
Abstract :
Large, state-of-the-art electronic systems require the generation of many timing and control signals. These signals typically emanate from a subsystem dedicated to this timing and control function. Since this subsystem is a primary controller of system operation, it is important to be able to test it effectively. Increased testability requirements in this area have created a need for more effective ways of testing this circuitry. Two proven methods for testing timing and control subsystems are reported. The methods involve the use of a built-in logic analyzer for data compression. Emphasis is on the attributes of each with respect to cost, complexity, and effectiveness
Keywords :
automatic testing; control systems; timing circuits; automatic testing; control circuitry; controller; data compression; logic analyzer; self testing; state-of-the-art electronic systems; subsystem; testing; timing circuitry; Built-in self-test; Circuit testing; Control systems; Costs; Data analysis; Data compression; Logic; Signal generators; System testing; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1988. Proceedings., Annual
Conference_Location :
Los Angeles, CA
Type :
conf
DOI :
10.1109/ARMS.1988.196427
Filename :
196427
Link To Document :
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