DocumentCode
299574
Title
DSP APPLICATION in INTERAL-NON-LINEARITY TESTING of A/D CONVERTERS
Author
Pei, Shiyan ; Chan, Shu-Park
Volume
1
fYear
1990
fDate
5-7 Nov 1990
Firstpage
516
Keywords
Analog-digital conversion; Circuit testing; Circuits and systems; Digital signal processing; Fast Fourier transforms; Histograms; Semiconductor device noise; Semiconductor device testing; Voltage; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals, Systems and Computers, 1990 Conference Record Twenty-Fourth Asilomar Conference on
ISSN
1058-6393
Print_ISBN
0-8186-2180-X
Type
conf
DOI
10.1109/ACSSC.1990.523391
Filename
523391
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