DocumentCode :
299574
Title :
DSP APPLICATION in INTERAL-NON-LINEARITY TESTING of A/D CONVERTERS
Author :
Pei, Shiyan ; Chan, Shu-Park
Volume :
1
fYear :
1990
fDate :
5-7 Nov 1990
Firstpage :
516
Keywords :
Analog-digital conversion; Circuit testing; Circuits and systems; Digital signal processing; Fast Fourier transforms; Histograms; Semiconductor device noise; Semiconductor device testing; Voltage; Working environment noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signals, Systems and Computers, 1990 Conference Record Twenty-Fourth Asilomar Conference on
ISSN :
1058-6393
Print_ISBN :
0-8186-2180-X
Type :
conf
DOI :
10.1109/ACSSC.1990.523391
Filename :
523391
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=299574
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