DocumentCode :
2996033
Title :
Combined fault-model free cause-effect and effect-cause fault diagnosis in block-level digital networks
Author :
Ubar, Raimund ; Kostin, Sergei ; Raik, Jaan
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
fYear :
2009
fDate :
15-16 July 2009
Firstpage :
385
Lastpage :
390
Abstract :
The main objective of this work is to combine the concept of fault model free diagnosis simultaneously with cause-effect and effect-cause analysis in digital networks. We consider the diagnosis as a two step task: first, to locate a subset of faulty blocks in a network by using block level fault dictionaries, second, to locate the faulty block in this subset by effect-cause analysis. The size of the fault dictionary depends linearly on the number of blocks to be determined as faulty or not faulty. We propose a measure for evaluating the block-level diagnostic resolution of a given network, and show how this measure can be used for guiding effect-cause diagnostic analysis. Experimental results provide the data which characterize the proposed measure.
Keywords :
digital integrated circuits; fault diagnosis; integrated circuit reliability; block-level diagnostic resolution; block-level digital networks; effect-cause fault diagnosis; fault dictionary; fault-model free cause-effect; Cause effect analysis; Circuit faults; Computer networks; Dictionaries; Failure analysis; Fault diagnosis; Integrated circuit yield; Logic circuits; Manufacturing; Semiconductor process modeling; block-level fault diagnosis; cause-effect and effect-cause analysis; diagnostic resolution; digital networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2009. ASQED 2009. 1st Asia Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-4952-1
Electronic_ISBN :
978-1-4244-4952-1
Type :
conf
DOI :
10.1109/ASQED.2009.5206232
Filename :
5206232
Link To Document :
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