Title :
Unbiased reliability with one bit error correction
Author_Institution :
Westinghouse Electr. Corp., Baltimore, MD, USA
Abstract :
Leading error correction code (ECC) semiconductor memory reliability prediction models are reviewed. The concept of biasness is discussed. An unbiased model development methodology is introduced by using a sample model with eight failure modes. A step-by-step prediction procedure is also provided to enable readers to use the new sample model
Keywords :
circuit reliability; error correction codes; integrated memory circuits; error correction code; failure modes; reliability prediction models; semiconductor memories; unbiased model; Block codes; Centralized control; Circuits; Error correction; Error correction codes; Hardware; Predictive models; Random access memory; Read-write memory; Registers;
Conference_Titel :
Reliability and Maintainability Symposium, 1988. Proceedings., Annual
Conference_Location :
Los Angeles, CA
DOI :
10.1109/ARMS.1988.196475
