Title :
Simplified Weibull modeling of component early life reliability
Author :
Musolino, Larry S. ; Conrad, Timothy R.
Author_Institution :
AT&T C&ES, Allentown, PA, USA
Abstract :
The need for a comprehensively nearly-life reliability monitor of electronic components is pointed out by the authors. Operational life testing was used to produce an early-life performance evaluation by exposing large samples of devices to simulated conditions of actual field use at the component manufacturing location. This testing produces failure time which are analyzed and associated with a simplified Weibull model of component early-life reliability
Keywords :
electron device testing; life testing; reliability; Weibull modeling; electron device testing; electronic components; failure time; life testing; nearly-life reliability; performance evaluation; Condition monitoring; Electronic components; Electronic equipment testing; Failure analysis; Life testing; Performance analysis; Performance evaluation; Process design; Quality assurance; Virtual manufacturing;
Conference_Titel :
Reliability and Maintainability Symposium, 1988. Proceedings., Annual
Conference_Location :
Los Angeles, CA
DOI :
10.1109/ARMS.1988.196479
