DocumentCode
2996248
Title
Simplified Weibull modeling of component early life reliability
Author
Musolino, Larry S. ; Conrad, Timothy R.
Author_Institution
AT&T C&ES, Allentown, PA, USA
fYear
1988
fDate
26-28 Jan 1988
Firstpage
379
Lastpage
382
Abstract
The need for a comprehensively nearly-life reliability monitor of electronic components is pointed out by the authors. Operational life testing was used to produce an early-life performance evaluation by exposing large samples of devices to simulated conditions of actual field use at the component manufacturing location. This testing produces failure time which are analyzed and associated with a simplified Weibull model of component early-life reliability
Keywords
electron device testing; life testing; reliability; Weibull modeling; electron device testing; electronic components; failure time; life testing; nearly-life reliability; performance evaluation; Condition monitoring; Electronic components; Electronic equipment testing; Failure analysis; Life testing; Performance analysis; Performance evaluation; Process design; Quality assurance; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1988. Proceedings., Annual
Conference_Location
Los Angeles, CA
Type
conf
DOI
10.1109/ARMS.1988.196479
Filename
196479
Link To Document