Title : 
Electrostatic and Piezoelectric Testing Methods for RF MEMS Resonators
         
        
            Author : 
Sepulveda, Nelson ; Toledo-Quiñones, Manuel
         
        
            Author_Institution : 
Univ. of Puerto Rico, Mayaguez
         
        
        
        
        
        
        
            Abstract : 
Two techniques to characterize diamond micromechanical resonator structures are described: (1) electrostatic testing, and (2) piezoelectric actuation with optical detection. It is found that, while the resonant frequency values obtained from the two techniques differ only by 3%, method (2) yield up to eight times larger estimates for the quality factor Q. After describing the techniques and discussing experimental results, an explanation based on the different pressure regimes used on the two testing methods is proposed to explain this apparent discrepancy.
         
        
            Keywords : 
Q-factor; electrostatics; micromechanical resonators; piezoelectricity; RF MEMS; diamond micromechanical resonator structures; electrostatic testing methods; piezoelectric testing methods; quality factor; resonant frequency; Electrostatics; Frequency estimation; Micromechanical devices; Optical detectors; Optical resonators; Q factor; Radiofrequency microelectromechanical systems; Resonant frequency; Testing; Yield estimation;
         
        
        
        
            Conference_Titel : 
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
         
        
            Conference_Location : 
San Juan
         
        
        
            Print_ISBN : 
1-4244-0172-0
         
        
            Electronic_ISBN : 
1548-3746
         
        
        
            DOI : 
10.1109/MWSCAS.2006.382084