DocumentCode :
2996463
Title :
Electrostatic and Piezoelectric Testing Methods for RF MEMS Resonators
Author :
Sepulveda, Nelson ; Toledo-Quiñones, Manuel
Author_Institution :
Univ. of Puerto Rico, Mayaguez
Volume :
1
fYear :
2006
fDate :
6-9 Aug. 2006
Firstpage :
405
Lastpage :
409
Abstract :
Two techniques to characterize diamond micromechanical resonator structures are described: (1) electrostatic testing, and (2) piezoelectric actuation with optical detection. It is found that, while the resonant frequency values obtained from the two techniques differ only by 3%, method (2) yield up to eight times larger estimates for the quality factor Q. After describing the techniques and discussing experimental results, an explanation based on the different pressure regimes used on the two testing methods is proposed to explain this apparent discrepancy.
Keywords :
Q-factor; electrostatics; micromechanical resonators; piezoelectricity; RF MEMS; diamond micromechanical resonator structures; electrostatic testing methods; piezoelectric testing methods; quality factor; resonant frequency; Electrostatics; Frequency estimation; Micromechanical devices; Optical detectors; Optical resonators; Q factor; Radiofrequency microelectromechanical systems; Resonant frequency; Testing; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location :
San Juan
ISSN :
1548-3746
Print_ISBN :
1-4244-0172-0
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2006.382084
Filename :
4267161
Link To Document :
بازگشت