• DocumentCode
    2996643
  • Title

    Platform stitching capacitors impact to high-speed differential links on non-ideal return path

  • Author

    Lun, Ching Kai ; Guan, Yew Teong ; Kheong, Yoon Chee ; Lee, Fabian Kung Wai ; Yong, Wong Hin ; Vetharatnam, Gobi

  • Author_Institution
    PDC (PG2), Intel Microelectron., Bayan Lepas, Malaysia
  • fYear
    2009
  • fDate
    15-16 July 2009
  • Firstpage
    216
  • Lastpage
    220
  • Abstract
    This paper discusses the validity of platform stitching capacitors in facilitating high-speed differential links signal return path on non-ideal reference plane. A platform design guideline for the stitching capacitor is recommended at the end of this study. The results from this study were used to enable a huge reduction in the number of platform stitching capacitors, which scored major design wins to both Intel internal and external customers. The cost saving is estimated to be approximately $10M cost saving following this design guidelines, more cost saving are expected if proliferate to other product platforms and establish good method for future product implementation. Our study shows that stitching capacitors have neither significantly improve nor degrade differential signal integrity performance on non-ideal return path. There is no direct relationship between the stitching capacitors and the frequency characteristics of the differential links on non-ideal return path. Before concluding this study, we perform time-domain analysis in HSPICE and Lab measurement was taken on actual system board for SATA and PCIe interfaces. All the eye diagram results captured are showing similar trend between simulation and measurement.
  • Keywords
    capacitors; time-domain analysis; HSPICE; Lab measurement; PCIe interfaces; SATA; differential signal integrity performance; high-speed differential link; nonideal return path; platform stitching capacitor; simulation; time-domain analysis; Capacitors; Costs; Degradation; Frequency measurement; Guidelines; Impedance measurement; Insertion loss; Loss measurement; Performance evaluation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2009. ASQED 2009. 1st Asia Symposium on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-4952-1
  • Electronic_ISBN
    978-1-4244-4952-1
  • Type

    conf

  • DOI
    10.1109/ASQED.2009.5206266
  • Filename
    5206266