Title :
Integrated system design, analysis and database-driven simulation model generation
Author :
Jeong, Ki-Young ; Allan, David
Author_Institution :
United Technol. Res. Center, East Hartford, CT, USA
Abstract :
This paper discusses an integrated framework of IDEF methods for generating a common data model usable for discrete manufacturing systems. From this data model, a simulation model is automatically generated using a database-driven and atom-based approach. A case study has been included to demonstrate the concept. A prototype function model, a data model and the resulting simulation model were constructed to show the feasibility of the approach. The concept and guidelines provided are expected to increase knowledge reusability between IDEF methods and improve simulation model reusability and maintainability through the features of the relational database technologies. Although the case study was performed for a semiconductor manufacturer, this concept can be easily extended to other areas.
Keywords :
data models; electronic engineering computing; electronics industry; manufacturing systems; relational databases; semiconductor device manufacture; systems engineering; IDEF methods; atom-based simulation model; data model; database-driven simulation model generation; discrete manufacturing systems; integrated system analysis; integrated system design; knowledge reusability; prototype function model; relational database; semiconductor manufacturer; simulation model maintainability; simulation model reusability; Analytical models; Data analysis; Data models; Failure analysis; Guidelines; Manufacturing systems; Relational databases; Silver; System analysis and design; Virtual prototyping;
Conference_Titel :
Simulation Symposium, 2004. Proceedings. 37th Annual
Print_ISBN :
0-7695-2110-X
DOI :
10.1109/SIMSYM.2004.1299468