DocumentCode :
2996724
Title :
Weak signal measurement via an accurate cross-spectral SVD-TLS approach
Author :
Ma, Yan ; Shi, Yaowu ; Dai, Yisong
Author_Institution :
Inst. of Inf. Sci. & Eng., Jilin Univ. of Technol., Changchun, China
fYear :
2000
fDate :
2000
Firstpage :
275
Lastpage :
278
Abstract :
This paper describes an accurate cross-spectral Singular Value Decomposition-Total Least Squares (SVD-TLS) method to measure the frequencies of weak sinusoidal signals in measurement noise. The new algorithm can overcome efficiently the shortcomings of low resolution caused by characteristic equation extention and distinguish perfectly the false peaks from the harmonic signal peaks in power spectrum figures. Simulation results show that this new cross-spectral SVD-TLS algorithm can eliminate spectral false peaks and have high resolution
Keywords :
least squares approximations; measurement theory; random noise; signal processing; singular value decomposition; spectral analysis; coloured noise; cross-spectral SVD-TLS approach; false peak removal; harmonic signal peaks; high resolution; measurement noise; singular value decomposition; spectral estimation; total least squares method; weak signal measurement; weak sinusoidal signals; Amplitude estimation; Colored noise; Equations; Frequency estimation; Frequency measurement; Information science; Noise measurement; Phase estimation; Signal processing; Signal resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2000. IEEE APCCAS 2000. The 2000 IEEE Asia-Pacific Conference on
Conference_Location :
Tianjin
Print_ISBN :
0-7803-6253-5
Type :
conf
DOI :
10.1109/APCCAS.2000.913487
Filename :
913487
Link To Document :
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