• DocumentCode
    2997052
  • Title

    Self-Correction Trace Model: A Full-System Simulator for Optical Network-on-Chip

  • Author

    Zhang, Mingzhe ; He, Liqiang ; Fan, Dongrui

  • Author_Institution
    Coll. of Comput. Sci., Inner Mongolia Univ., Hohhot, China
  • fYear
    2012
  • fDate
    21-25 May 2012
  • Firstpage
    242
  • Lastpage
    247
  • Abstract
    The improvement of the emerging technology involves the nanophotonic into the on-chip interconnection, which provides a large communication capability for the future large-scale CMP processor. As an important way to the architecture research, full-system simulation has been adopted by many researchers. Since the optical devices are fundamentally different from the conventional electronic elements, new methodology and tools are needed to simulate an Optical Network-on-Chip (ONOC) with real workload. In this paper, we introduce a high precise full-system ONOC simulation system. To build this system, we propose a self-correction trace model for accurate simulation in a reasonable period of time. Finally, to test our simulation system, we present a simple case-study to compare our system running real application with a baseline NOC simulator. The result shows that our simulation system achieves a high precision, while not substantially extend the total simulation time.
  • Keywords
    nanophotonics; network-on-chip; optoelectronic devices; baseline NOC simulator; communication capability; electronic elements; full-system ONOC simulation system; full-system simulator; large-scale CMP processor; nanophotonics; on-chip interconnection; optical devices; optical network-on-chip; self-correction trace model; Accuracy; Computational modeling; Garnets; Optical crosstalk; Optical devices; Optical interconnections; System-on-a-chip; Network-on-Chip; full-system simulation; nanophotonic; self-correction; trace;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2012 IEEE 26th International
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4673-0974-5
  • Type

    conf

  • DOI
    10.1109/IPDPSW.2012.26
  • Filename
    6270645