Title :
Field Emission Localization In Narro´wv Solid Angles
Author :
Fursey, Georgy N.
Author_Institution :
Bonch-Bruyevich University of Telecommunications
Keywords :
Current density; Electron emission; Electron microscopy; Holography; Lenses; Solids; Stability;
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
DOI :
10.1109/IVMC.1993.700255
