DocumentCode
2997139
Title
Multilevel interconnect planarization by voltage and laser programmable links using ion implantation
Author
Herndon, T.O. ; Burns, J.A. ; Chapman, G.H. ; Raffel, J.I.
Author_Institution
MIT Lincoln Lab., Lexington, MA, USA
fYear
1989
fDate
12-13 Jun 1989
Firstpage
322
Lastpage
328
Abstract
A technique is described whereby implantation of silicon through a mask into the intermetal insulator modifies the insulation. After deposition and definition of the upper metal, the implanted regions between metal levels act as voltage programmable links. Application of a voltage between upper and lower metal electrodes causes the implanted insulation to become conductive, producing a low-resistance, planar, vertical connection. Alternatively, these implanted areas can be rendered conducting by exposure to a focused laser beam
Keywords
VLSI; ion implantation; laser beam applications; metallisation; Si ion implantation; VLSI; conductive implanted insulation layer; interconnect planarization; intermetal insulator; laser programmable links; multilevel interconnection; via programmable links; voltage programmable links; Contacts; Dielectrics and electrical insulation; Electric breakdown; Etching; Implants; Integrated circuit interconnections; Ion implantation; Planarization; Silicon compounds; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Multilevel Interconnection Conference, 1989. Proceedings., Sixth International IEEE
Conference_Location
Santa Clara, CA
Type
conf
DOI
10.1109/VMIC.1989.77991
Filename
77991
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