• DocumentCode
    2997139
  • Title

    Multilevel interconnect planarization by voltage and laser programmable links using ion implantation

  • Author

    Herndon, T.O. ; Burns, J.A. ; Chapman, G.H. ; Raffel, J.I.

  • Author_Institution
    MIT Lincoln Lab., Lexington, MA, USA
  • fYear
    1989
  • fDate
    12-13 Jun 1989
  • Firstpage
    322
  • Lastpage
    328
  • Abstract
    A technique is described whereby implantation of silicon through a mask into the intermetal insulator modifies the insulation. After deposition and definition of the upper metal, the implanted regions between metal levels act as voltage programmable links. Application of a voltage between upper and lower metal electrodes causes the implanted insulation to become conductive, producing a low-resistance, planar, vertical connection. Alternatively, these implanted areas can be rendered conducting by exposure to a focused laser beam
  • Keywords
    VLSI; ion implantation; laser beam applications; metallisation; Si ion implantation; VLSI; conductive implanted insulation layer; interconnect planarization; intermetal insulator; laser programmable links; multilevel interconnection; via programmable links; voltage programmable links; Contacts; Dielectrics and electrical insulation; Electric breakdown; Etching; Implants; Integrated circuit interconnections; Ion implantation; Planarization; Silicon compounds; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Multilevel Interconnection Conference, 1989. Proceedings., Sixth International IEEE
  • Conference_Location
    Santa Clara, CA
  • Type

    conf

  • DOI
    10.1109/VMIC.1989.77991
  • Filename
    77991