• DocumentCode
    2997244
  • Title

    Measurement of worst-case power delivery noise and construction of worst case current for graphics core simulation

  • Author

    Tan, Fern Nee

  • Author_Institution
    Penang Design Center, Intel Microelectron., Bayan Lepas, Malaysia
  • fYear
    2009
  • fDate
    15-16 July 2009
  • Firstpage
    59
  • Lastpage
    63
  • Abstract
    Worst case graphics core power delivery noise is a major indicator of graphics chip performance. The design of good graphics core power delivery network (PDN) is technically difficult because it is not easy to predict a worst case current stimulus during pre-silicon design stage. Many times, the worst case power delivery noise is observed when graphics benchmark software is run during post-silicon validation. At times like this, it is too late to rectify the power delivery noise issue unless many extra capacitor placeholders are placed during early design stage. To intelligently optimize the graphics core power delivery network design and determining the right amount of decoupling capacitors, this paper suggests an approach that setup a working platform to capture the worst case power delivery noise; and later re-construct the worst case power delivery current using Thevenin´s Theorem. The measurement is based on actual gaming application instead of engineering a special stimulus that is generated thru millions of logic test-vectors. This approach is practical, direct and quick, and does not need huge computing resources; or technically skilled logic designers to design algorithms to build the stimulus.
  • Keywords
    circuit simulation; deconvolution; logic circuits; microprocessor chips; network synthesis; Thevenin theorem; decoupling capacitors; graphic core simulation; logic designers; logic test-vectors; power delivery network; worst case current; worst-case power delivery noise; Algorithm design and analysis; Capacitors; Current measurement; Design optimization; Graphics; Intelligent networks; Logic testing; Noise measurement; Power measurement; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2009. ASQED 2009. 1st Asia Symposium on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-4952-1
  • Electronic_ISBN
    978-1-4244-4952-1
  • Type

    conf

  • DOI
    10.1109/ASQED.2009.5206296
  • Filename
    5206296