Title :
Architecture validation for processors
Author :
Ho, Richard C. ; Yang, C. Han ; Horowitz, Mark A. ; Dill, David L.
Author_Institution :
Comput. Syst. Lab., Stanford Univ., CA, USA
Abstract :
Modern, high performance microprocessors are extremely complex machines which require substantial validation effort to ensure functional correctness prior to tapeout. Generating the corner cases to test these designs is a mostly manual process, where completion is hard to judge. Experience shows that the errors that are caught late in the design, many post-silicon, are interactions between different components in very improbable corner case situations. In this paper we present a technique that targets such error-causing interactions by automatically generating test vectors that will cause the processor to exercise all transitions of the control logic in simulation. We use techniques from formal verification to derive transition tours of a fully enumerated state graph of the control logic of the processor. Our system works from a Verilog description of the original machine and is currently being used to validate an embedded dual-issue processor in the node controller of the Stanford FLASH Multiprocessor. Modeling the processor control results in 200 K states and an 8M instruction trace to check all transitions of control arcs.
Keywords :
formal verification; microprocessor chips; Stanford FLASH Multiprocessor; Verilog description; architecture validation; control logic; error-causing interactions; formal verification; fully enumerated state graph; functional correctness; high performance microprocessors; instruction trace; node controller; processors; test vectors; Automatic control; Automatic generation control; Automatic logic units; Automatic testing; Control systems; Error correction; Formal verification; Hardware design languages; Logic testing; Microprocessors;
Conference_Titel :
Computer Architecture, 1995. Proceedings., 22nd Annual International Symposium on
Conference_Location :
Santa Margherita Ligure, Italy
Print_ISBN :
0-89791-698-0