DocumentCode
2997460
Title
Statistical behavioral modeling and characterization of A/D converters
Author
Peralias, E.J. ; Rueda, A. ; Huertas, Jose Luis
Author_Institution
Centro Nacional de Microelectron., Seville Univ., Spain
fYear
1995
fDate
5-9 Nov. 1995
Firstpage
562
Lastpage
566
Abstract
This paper presents a method to characterize Nyquist rate A/D converters based on the use of a first order statistical behavioral model. The proposed model is derived from a very basic statistical interpretation of the conversion operation which contemplates noise and statistical process variations effects on traditional converter parameters. Both DC and dynamic converter parameters can be easily measured. The applicability of the proposed method is illustrated with two different examples. The first serves to show the possibility of deriving the statistical behavioral model from real measured data, and to prove the correctness of the model by comparing results to those obtained with traditional deterministic models. The second example illustrates the incorporation of the model in the mixed-signal simulator ELDO. The obtained results show that despite the model´s simplicity, it is very efficient for quick and complete simulation of data converters.
Keywords
analogue-digital conversion; circuit analysis computing; convertors; electronic engineering computing; semiconductor device models; A/D converters; ELDO; behavioral modeling; characterization; data converter; mixed-signal simulator; statistical behavioral model; Circuit noise; Costs; Distribution functions; Electronic mail; Noise generators; Production; Semiconductor device measurement; Signal generators; Signal processing; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
ISSN
1092-3152
Print_ISBN
0-8186-8200-0
Type
conf
DOI
10.1109/ICCAD.1995.480172
Filename
480172
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