DocumentCode :
2997710
Title :
Timing optimization with testability considerations
Author :
Saldanha, A. ; Brayton, R.K. ; Sangiovanni-Vincentelli, A.L. ; Cheng, K.-T.
Author_Institution :
California Univ., Berkeley, CA, USA
fYear :
1990
fDate :
11-15 Nov. 1990
Firstpage :
460
Lastpage :
463
Abstract :
Since redundancy is undesirable in high performance circuits, the authors explore timing optimization procedures to determine whether performance optimization may be achieved without introducing redundancy. They demonstrate the conditions under which timing optimization may introduce single stuck-fault redundancies into a given irredundant circuit and illustrate the difficulties in removing or preventing these redundancies. The authors then resolve the question of whether a testability criterion exists that may be retained or easily maintained as invariant during timing resynthesis.<>
Keywords :
logic design; logic testing; redundancy; high performance circuits; irredundant circuit; redundancy; testability considerations; timing optimization; timing resynthesis; Circuit faults; Circuit testing; Delay; Integrated circuit testing; Logic testing; Optimization; Redundancy; Robustness; System testing; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1990. ICCAD-90. Digest of Technical Papers., 1990 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-2055-2
Type :
conf
DOI :
10.1109/ICCAD.1990.129953
Filename :
129953
Link To Document :
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